Surface Analysis Laboratory - XPS and AFM

Surface Analysis Laboratory - XPS and AFM

Instrumentation

UHV-XPS Characterization

Fully automated ThermoFisher Nexsa G2 X-ray photoelectron spectrometer (XPS) fitted with a variable size X-ray spot (Al source) with a MAGCIS sputtering gun. Data from the Nexsa G2 can be correlated to scanning electron microscopy images. The system also capable of ultraviolet photoelectron spectroscopy and angle resolved XPS.

Near Ambient Pressure XPS (NAP-XPS) 

SAL houses a newly installed near ambient pressure XPS (NAP-XPS) designed by SPECS that utilizes an in-situ cell capable of conducting XPS measurements in the presence of a gas of interest up to a maximum pressure of 20 mbar. The cell temperature can also be varied in the range of 200-800 K. The system is fitted with a monochromated Al K-α source and an Ar ion sputtering gun. Lastly, a residual gas analyzer is fitted to examine the gas phase flowing through the cell. For more details please visit the NAP-XPS proposal submission page.

Purchase of the ambient pressure XPS was supported by that National Science Foundation through NSF MRI award 1625792.

Bruker Icon Dimension AFM

Bruker Icon Dimension AFM can provide a high-resolution image of the topography of a sample's surface. Some of the options available are heated transition imaging and liquid imaging. The system is compatible with Bruker’s “ScanAsyst” modes, contact and tapping modes.

Easy XAFS 300+ X-ray Absorption Fine Structure

A dedicated high throughput laboratory system for x-ray absorption fine structure in transmission mode for X-ray absorption near edge spectroscopy (XANES) along with extended x-ray absorption fine structure (EXAFS) with sample cooling. Accessible elements are primarily first and third row transition elements along with the lanthanides. Additionally, a dedicated x-ray tube for x-ray emission spectroscopy is available.